Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-07-17
2007-07-17
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
11078150
ABSTRACT:
A method and apparatus for conserving power of a mixed-signal system-on-a-chip having analog circuitry, involving determination of an analog variation parameter that is representative of an integrated circuit fabrication process variance of the integrated circuit, and an operational temperature associated with the analog variation parameter. With the analog variation parameter and the operational temperature, an adjustment signal is determined for a power supply level of the integrated circuit, such that power consumption of the integrated circuit is optimized. Further, in mixed-signal integrated circuits with digital and analog circuitry, a digital variation parameter is determined, where the adjustment signal determination is based on the digital variation parameter and the analog variation parameter with respect to the operational temperature. With such a method and apparatus, power consumption is optimized on an IC-by-IC basis such that power consumption of each IC is optimized.
REFERENCES:
patent: 5563928 (1996-10-01), Rostoker et al.
Felder Matthew D.
May Marcus W.
Barlow John
Garlick & Harrison & Markison
Sigmatel, Inc.
Smith Kevin L.
Sun Xiuqin
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