Power MOSFET with ultra-deep base and reduced on resistance

Semiconductor device manufacturing: process – Making regenerative-type switching device – Having field effect structure

Reexamination Certificate

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Reexamination Certificate

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06846706

ABSTRACT:
A MOS-gated semiconductor device is shown and described which includes deep implanted junctions and thick oxide spacers disposed over a substantial portion of common conduction regions.

REFERENCES:
patent: 5981998 (1999-11-01), Frisina et al.
patent: 5985721 (1999-11-01), Frisina et al.
patent: 6008520 (1999-12-01), Darwish et al.
patent: 6380569 (2002-04-01), Chang et al.
patent: 6468866 (2002-10-01), Frisina et al.

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