Power amplifier circuit with low degradation in the event of bre

Amplifiers – With plural amplifier channels – Redundant amplifier circuits

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

330 51, H03F 368, H03F 114

Patent

active

060140569

ABSTRACT:
The invention relates to a configuration of power amplifiers comprising firstly N inputs and N outputs, and secondly N amplification channels. The configuration is such that all of the amplification channels have substantially the same power even if the input signals are of different powers. Each amplification channel has at least one cell comprising two preferably identical amplifiers connected to first and second ports of a coupler having a third port constituting the output of the cell. An input coupler is preferably also provided having one port that constitutes the input of the cell and two other ports respectively connected to the inputs of the amplifiers. Each cell includes means for recombining the signals on the ports of the output coupler in such a manner as to maximize the output power in the event of one of the amplifiers breaking down.

REFERENCES:
patent: 4010426 (1977-03-01), Rambo
patent: 4618831 (1986-10-01), Egami et al.
patent: 5083094 (1992-01-01), Forsberg
patent: 5610556 (1997-03-01), Rubin
patent: 5638024 (1997-06-01), Dent et al.
patent: 5675285 (1997-10-01), Winters
Patent Abstracts of Japan, vol. 009, No. 027 (E-294), Feb. 6, 1985 corresponding to JP 59 172816 A (Nippon Denki KK) Sep. 29, 1984.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Power amplifier circuit with low degradation in the event of bre does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Power amplifier circuit with low degradation in the event of bre, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Power amplifier circuit with low degradation in the event of bre will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1465204

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.