Potential measuring apparatus

Details Potential measuring apparatus Potential measuring apparatus

2008-05-12

2010-06-22

He, Amy (Department: 2831)

Electricity: measuring and testing

Electrostatic field

Using modulation-type electrometer

C324S457000

Reexamination Certificate

active

07741851

ABSTRACT:
A potential measuring apparatus has a detection electrode on which an electric charge is induced according to a potential of a detection object, and a modulator for altering the generated quantity of the electric charge. The detection electrode has at least one depressed portion on a surface opposite to the detection object.

REFERENCES:
patent: 3852667 (1974-12-01), Williams et al.
patent: 4205267 (1980-05-01), Williams
patent: 4720682 (1988-01-01), Ikushima et al.
patent: 4763078 (1988-08-01), Williams
patent: 4835461 (1989-05-01), Snelling
patent: 5212451 (1993-05-01), Werner, Jr.
patent: 5317152 (1994-05-01), Takamatsu et al.
patent: 5357108 (1994-10-01), Suzuki et al.
patent: 5554851 (1996-09-01), Hirai et al.
patent: 5574279 (1996-11-01), Ikeda et al.
patent: 5767687 (1998-06-01), Geist
patent: 5923637 (1999-07-01), Shimada et al.
patent: 6046972 (2000-04-01), Kuroda et al.
patent: 6075639 (2000-06-01), Kino et al.
patent: 6163032 (2000-12-01), Rockwood
patent: 6163519 (2000-12-01), Kuroda et al.
patent: 6177800 (2001-01-01), Kubby et al.
patent: 6337477 (2002-01-01), Shimada et al.
patent: 6633172 (2003-10-01), Doemens et al.
patent: 6806717 (2004-10-01), Werner, Jr. et al.
patent: 6831765 (2004-12-01), Yasuda et al.
patent: 6965239 (2005-11-01), Yasuda et al.
patent: 7149442 (2006-12-01), Ushijima et al.
patent: 7212007 (2007-05-01), Yasuda et al.
patent: 7242882 (2007-07-01), Ichimura et al.
patent: 7265554 (2007-09-01), Ichimura et al.
patent: 7274193 (2007-09-01), Yasuda et al.
patent: 2003/0042907 (2003-03-01), Kieres et al.
patent: 2003/0057977 (2003-03-01), Werner, Jr. et al.
patent: 2004/0136045 (2004-07-01), Tran
patent: 2005/0046918 (2005-03-01), Yasuda et al.
patent: 2005/0174209 (2005-08-01), Teshima et al.
patent: 2006/0001432 (2006-01-01), Yasuda et al.
patent: 2006/0008284 (2006-01-01), Ushijima et al.
patent: 2006/0158196 (2006-07-01), Ichimura et al.
patent: 2006/0171728 (2006-08-01), Ichimura et al.
patent: 2007/0154231 (2007-07-01), Ichimura et al.
patent: 2007/0229086 (2007-10-01), Ichimura
patent: 2007/0247166 (2007-10-01), Ichimura et al.
patent: 2715831 (1978-10-01), None
patent: 3410527 (1984-10-01), None
patent: 10044887 (2001-05-01), None
patent: 1234799 (2002-08-01), None
patent: 2071166 (1990-03-01), None
patent: 4025764 (1992-01-01), None
patent: 6196721 (1994-07-01), None
patent: 6196722 (1994-07-01), None
patent: 2000180490 (2000-06-01), None
patent: 2004088333 (2004-10-01), None
patent: 2004088335 (2004-10-01), None
patent: WO 2004088336 (2004-10-01), None
C.H. Hsu, et al., “Micromechanical Electrostatic Voltmeter” Transducers, San Francisco, Jun. 24-27, 1991, Proceedings of the International Conference on Solid State Sensors and Actuators, New York, IEEE, U.S., pp. 659-662.
P.S. Riehl, “Microsystems for Electrostatic Sensing” Dissertation, Nov. 2002, pp. 1-110 (available at http://www-bsac.eecs.berkeley.edu/publicaitions/search/zoom.php?urltimestamp=1040564878).

Affiliated with

Also associated with

Rating

Potential measuring apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Potential measuring apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Potential measuring apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4183725