Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-08-02
2011-08-02
Phan, Huy (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S457000, C324S072000
Reexamination Certificate
active
07990159
ABSTRACT:
A potential measurement apparatus for measuring a surface potential of an object of measurement detects a change in electric charge induced at a detection electrode due to electrostatic induction by changing a distance between the detection electrode and the object of measurement in accordance with a predetermined period, using a neutral distance as reference, as a signal representing a change in electric current. The potential measurement apparatus includes a first detection unit for detecting a signal representing a fundamental period of the change in electric current and a signal representing a second harmonic period, a second detection unit for detecting information representing a capacitance between the detection electrode at the neutral distance and the object of measurement and an arithmetic unit for computationally obtaining information on the surface potential of the object of measurement, with eliminating an influence of the neutral distance and the capacitance, according to an outcome of detection of the first detection unit and an outcome of detection of the second detection unit.
REFERENCES:
patent: 4205267 (1980-05-01), Williams
patent: 4894607 (1990-01-01), Kumada
patent: 5212451 (1993-05-01), Werner, Jr.
patent: 7242882 (2007-07-01), Ichimura et al.
patent: 7265554 (2007-09-01), Ichimura et al.
patent: 7274193 (2007-09-01), Yasuda et al.
patent: 2003/0057977 (2003-03-01), Werner, Jr. et al.
patent: 2003/0175945 (2003-09-01), Thompson et al.
patent: 2006/0267593 (2006-11-01), Ichimura et al.
patent: 2007/0065169 (2007-03-01), Kandori et al.
patent: 2008/0112717 (2008-05-01), Zaitsu et al.
patent: 2008/0116897 (2008-05-01), Ushijima et al.
patent: 2008/0122454 (2008-05-01), Kato
patent: 1003044 (2000-05-01), None
patent: 62-110372 (1987-05-01), None
patent: 7-244103 (1995-09-01), None
patent: 2000-147036 (2000-05-01), None
patent: 03/033993 (2003-04-01), None
International Search Report and Written Opinion dated Jul. 24, 2008 in International Application No. PCT/2008/051693, filed Jan. 28, 2008.
P.S. Riehl, et al., “Microsystems for Electrostatic Sensing”, Reg. ID. 1040564878, (Nov. 2002).
International Preliminary Report on Patentability dated Aug. 13, 2009 in International Application No. PCT/2008/051693, filed Jan. 28, 2008.
Hirose Futoshi
Kandori Atsushi
Kato Kazuhiko
Noguchi Kaoru
Ogawa Toshiyuki
Canon Kabushiki Kaisha
Fitzpatrick ,Cella, Harper & Scinto
Phan Huy
Vazquez Arleen M
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