Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration
Reexamination Certificate
2007-06-12
2007-06-12
Picardat, Kevin M. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified configuration
C257S690000, C257S700000, C257S774000, C257SE21575, C438S618000, C438S622000, C438S624000
Reexamination Certificate
active
10685872
ABSTRACT:
A new method is provided for the creation of interconnect lines. Fine line interconnects are provided in a first layer of dielectric overlying semiconductor circuits that have been created in or on the surface of a substrate. A layer of passivation is deposited over the layer of dielectric, a thick second layer of dielectric is created over the surface of the layer of passivation. Thick and wide interconnect lines are created in the thick second layer of dielectric. The first layer of dielectric may also be eliminated, creating the wide thick interconnect network on the surface of the layer of passivation that has been deposited over the surface of a substrate.
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U.S. Appl. No. 10/154,662, filed May 24, 2002, “Top Layers of Metal for High Performance IC's”.
Ackerman Stephen B.
Megica Corporation
Picardat Kevin M.
Pike Rosemary L. S.
Saile Ackerman LLC
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