Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...
Patent
1998-11-19
2000-02-15
Gulakowski, Randy
Cleaning and liquid contact with solids
Processes
Including application of electrical radiant or wave energy...
510175, 510176, B08B 600, C11D 904
Patent
active
060241063
ABSTRACT:
A post-CMP wafer clean process. A post-CMP wafer is provided. A portion of particles and slurry are removed from the wafer by double side scrubber. The residual particles and slurry are then removed from the wafer in a solvent tank by magasonic and a solvent in the solvent tank includes an amine-based compound.
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Lur Water
Wu Juan-Yuan
Yang Ming-Sheng
Gulakowski Randy
United Microelectronics Corp.
Wilkins Yolanda E.
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