Positive tone bi-layer imprint lithography method

Etching a substrate: processes – Masking of a substrate using material resistant to an etchant – Mechanically forming pattern into a resist

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C216S039000, C216S041000, C216S047000, C216S052000, C216S057000, C216S072000, C216S079000, C264S220000, C264S425000, C156S242000, C156S247000, C156S272800, C156S289000

Reexamination Certificate

active

10396615

ABSTRACT:
The present invention provides a method to pattern a substrate which features creating a multi-layered structure by forming, on the substrate, a patterned layer having protrusions and recessions. Formed upon the patterned layer is a conformal layer, with the multi-layered structure having a crown surface facing away from the substrate. Portions of the multi-layered structure are removed to expose regions of the substrate in superimposition with the protrusions, while forming a hard mask in areas of the crown surface in superimposition with the recessions.

REFERENCES:
patent: 3783520 (1974-01-01), King
patent: 4070116 (1978-01-01), Frosch et al.
patent: 4119688 (1978-10-01), Hiraoka
patent: 4201800 (1980-05-01), Alcorn et al.
patent: 4267212 (1981-05-01), Sakawaki
patent: 4426247 (1984-01-01), Tamamura et al.
patent: 4507331 (1985-03-01), Hiraoka
patent: 4512848 (1985-04-01), Deckman et al.
patent: 4517337 (1985-05-01), Lockhart et al.
patent: 4552833 (1985-11-01), Ito et al.
patent: 4600309 (1986-07-01), Fay
patent: 4657845 (1987-04-01), Frechet et al.
patent: 4692205 (1987-09-01), Sachdev et al.
patent: 4707218 (1987-11-01), Giammarco et al.
patent: 4731155 (1988-03-01), Napoli et al.
patent: 4737425 (1988-04-01), Lin et al.
patent: 4808511 (1989-02-01), Holmes
patent: 4826943 (1989-05-01), Ito et al.
patent: 4848911 (1989-07-01), Uchida et al.
patent: 4857477 (1989-08-01), Kanamori
patent: 4891303 (1990-01-01), Garza et al.
patent: 4908298 (1990-03-01), Hefferon et al.
patent: 4919748 (1990-04-01), Bredbenner et al.
patent: 4921778 (1990-05-01), Thackeray et al.
patent: 4931351 (1990-06-01), McColgin et al.
patent: 4959252 (1990-09-01), Bonnebat et al.
patent: 4964945 (1990-10-01), Calhoun
patent: 4976818 (1990-12-01), Hashimoto et al.
patent: 4980316 (1990-12-01), Huebner
patent: 4999280 (1991-03-01), Hiraoka
patent: 5028366 (1991-07-01), Harakal et al.
patent: 5053318 (1991-10-01), Gulla et al.
patent: 5071694 (1991-12-01), Uekita et al.
patent: 5074667 (1991-12-01), Miyatake
patent: 5108875 (1992-04-01), Thackeray et al.
patent: 5110514 (1992-05-01), Soane
patent: 5148036 (1992-09-01), Matsugu et al.
patent: 5148037 (1992-09-01), Suda et al.
patent: 5151754 (1992-09-01), Ishibashi et al.
patent: 5169494 (1992-12-01), Hashimoto et al.
patent: 5173393 (1992-12-01), Sezi et al.
patent: 5179863 (1993-01-01), Uchida et al.
patent: 5198326 (1993-03-01), Hashimoto et al.
patent: 5206983 (1993-05-01), Guckel et al.
patent: 5212147 (1993-05-01), Sheats
patent: 5234793 (1993-08-01), Sebald et al.
patent: 5240550 (1993-08-01), Boehnke et al.
patent: 5240878 (1993-08-01), Fitzsimmons et al.
patent: 5242711 (1993-09-01), DeNatale et al.
patent: 5244818 (1993-09-01), Jokerst et al.
patent: 5259926 (1993-11-01), Kuwabara et al.
patent: 5314772 (1994-05-01), Kozicki et al.
patent: 5318870 (1994-06-01), Hartney
patent: 5324683 (1994-06-01), Fitch et al.
patent: 5328810 (1994-07-01), Lowrey et al.
patent: 5330881 (1994-07-01), Sidman et al.
patent: 5362606 (1994-11-01), Hartney et al.
patent: 5366851 (1994-11-01), Novembre
patent: 5374454 (1994-12-01), Bickford et al.
patent: 5376810 (1994-12-01), Hoenk et al.
patent: 5380474 (1995-01-01), Rye et al.
patent: 5417802 (1995-05-01), Obeng
patent: 5421981 (1995-06-01), Leader et al.
patent: 5422295 (1995-06-01), Choi et al.
patent: 5424549 (1995-06-01), Feldman
patent: 5425848 (1995-06-01), Haisma et al.
patent: 5431777 (1995-07-01), Austin et al.
patent: 5434107 (1995-07-01), Paranjpe
patent: 5439766 (1995-08-01), Day et al.
patent: 5453157 (1995-09-01), Jeng
patent: 5458520 (1995-10-01), DeMercurio et al.
patent: 5468542 (1995-11-01), Crouch
patent: 5480047 (1996-01-01), Tanigawa et al.
patent: 5512131 (1996-04-01), Kumar et al.
patent: 5527662 (1996-06-01), Hashimoto et al.
patent: 5545367 (1996-08-01), Bae et al.
patent: 5597438 (1997-01-01), Grewal et al.
patent: 5601641 (1997-02-01), Stephens
patent: 5654238 (1997-08-01), Cronin et al.
patent: 5669303 (1997-09-01), Maracas et al.
patent: 5670415 (1997-09-01), Rust
patent: 5700626 (1997-12-01), Lee et al.
patent: 5725788 (1998-03-01), Maracas et al.
patent: 5736424 (1998-04-01), Prybyla et al.
patent: 5743998 (1998-04-01), Park
patent: 5753014 (1998-05-01), Van Rijn
patent: 5772905 (1998-06-01), Chou
patent: 5776748 (1998-07-01), Singhvi et al.
patent: 5820769 (1998-10-01), Chou
patent: 5849209 (1998-12-01), Kindt-Larsen et al.
patent: 5849222 (1998-12-01), Jen et al.
patent: 5855686 (1999-01-01), Rust
patent: 5888650 (1999-03-01), Calhoun et al.
patent: 5895263 (1999-04-01), Carter et al.
patent: 5900160 (1999-05-01), Whitesides et al.
patent: 5905104 (1999-05-01), Eklund et al.
patent: 5907782 (1999-05-01), Wu
patent: 5926690 (1999-07-01), Toprac et al.
patent: 5948219 (1999-09-01), Rohner
patent: 5948470 (1999-09-01), Harrison et al.
patent: 5948570 (1999-09-01), Kornblit et al.
patent: 5956216 (1999-09-01), Chou
patent: 5962191 (1999-10-01), Nozaki et al.
patent: 6033977 (2000-03-01), Gutsche et al.
patent: 6035805 (2000-03-01), Rust
patent: 6039897 (2000-03-01), Lochhead et al.
patent: 6046056 (2000-04-01), Parce et al.
patent: 6071372 (2000-06-01), Ye et al.
patent: 6074827 (2000-06-01), Nelson et al.
patent: 6096655 (2000-08-01), Lee et al.
patent: 6143412 (2000-11-01), Schueller et al.
patent: 6150190 (2000-11-01), Stankus et al.
patent: 6150231 (2000-11-01), Muller et al.
patent: 6150680 (2000-11-01), Eastman et al.
patent: 6168845 (2001-01-01), Fontana, Jr. et al.
patent: 6218316 (2001-04-01), Marsh
patent: 6232175 (2001-05-01), Liu et al.
patent: 6245581 (2001-06-01), Bonser et al.
patent: 6274294 (2001-08-01), Hines
patent: 6309580 (2001-10-01), Chou
patent: 6326627 (2001-12-01), Putvinski et al.
patent: 6329256 (2001-12-01), Ibok
patent: 6334960 (2002-01-01), Willson et al.
patent: 6342097 (2002-01-01), Terry et al.
patent: 6355198 (2002-03-01), Kim et al.
patent: 6383928 (2002-05-01), Eissa
patent: 6387783 (2002-05-01), Furukawa et al.
patent: 6387787 (2002-05-01), Mancini et al.
patent: 6388253 (2002-05-01), Su
patent: 6391217 (2002-05-01), Schaffer et al.
patent: 6391798 (2002-05-01), DeFelice et al.
patent: 6426288 (2002-07-01), Meikle
patent: 6455411 (2002-09-01), Jiang et al.
patent: 6468853 (2002-10-01), Balasubramanian et al.
patent: 6468896 (2002-10-01), Rohr et al.
patent: 6482742 (2002-11-01), Chou
patent: 6489068 (2002-12-01), Kye
patent: 6495430 (2002-12-01), Tsai et al.
patent: 6514672 (2003-02-01), Young et al.
patent: 6517977 (2003-02-01), Resnick et al.
patent: 6517995 (2003-02-01), Jacobson et al.
patent: 6518168 (2003-02-01), Clem et al.
patent: 6518189 (2003-02-01), Chou
patent: 6534418 (2003-03-01), Plat et al.
patent: 6541360 (2003-04-01), Plat et al.
patent: 6561706 (2003-05-01), Singh et al.
patent: 6565928 (2003-05-01), Sakamoto et al.
patent: 6566258 (2003-05-01), Dixit et al.
patent: 6632742 (2003-10-01), Yang et al.
patent: 6635581 (2003-10-01), Wong
patent: 6646662 (2003-11-01), Nebashi et al.
patent: 6677252 (2004-01-01), Marsh
patent: 6686271 (2004-02-01), Raaijmakers et al.
patent: 6696220 (2004-02-01), Bailey et al.
patent: 6703190 (2004-03-01), Elian et al.
patent: 6713238 (2004-03-01), Chou et al.
patent: 6716767 (2004-04-01), Shih et al.
patent: 6719915 (2004-04-01), Willson et al.
patent: 6730256 (2004-05-01), Bloomstein et al.
patent: 6737202 (2004-05-01), Gehoski et al.
patent: 6743713 (2004-06-01), Mukherjee-Roy et al.
patent: 6759325 (2004-07-01), Raaijmakers et al.
patent: 6767983 (2004-07-01), Fujiyama et al.
patent: 6770852 (2004-08-01), Steger
patent: 6776094 (2004-08-01), Whitesides et al.
patent: 6777170 (2004-08-01), Bloomstein et al.
patent: 6809356 (2004-10-01), Chou
patent: 6814879 (2004-11-01), Shibata
patent: 6820677 (2004-11-01), Grinberg et al.
patent: 6828244 (2004-12-01), Chou
patent: 6849558 (2005-02-01), Schaper
patent: 6900881 (2005-05-01), Sreenivasan et al.
patent: 6908861 (2005-06-01), Sreenivasan et al.
patent: 6916584 (2005-07-01), Sreenivasan et al.
patent: 6932934 (2005-08-01), Choi et al.
patent: 2002/0036183 (2002-03-01), Shibata
patent: 2002/0042027 (2002-04-01), Chou et al.
patent: 2002/0132482 (2002-09-0

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Positive tone bi-layer imprint lithography method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Positive tone bi-layer imprint lithography method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Positive tone bi-layer imprint lithography method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3848511

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.