Positioning method for biochip

Optics: measuring and testing – Position or displacement

Reexamination Certificate

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Details

C435S006120, C435S287200

Reexamination Certificate

active

11055143

ABSTRACT:
Disclosed is a positioning method for biochip spotting, which can spot the bio-probe precisely on the specific position of a biochip substrate, and the steps thereof comprising: (a) providing reference points on a biochip substrate; (b) taking an image of the position of each reference point; (c) calculating a first spotting position and performing spotting according to position information of the image of the positions of reference points of step (b); (d) taking and recording the image of the spotted position; (e) calculating to make feedback correction and setting up the next spotting position according to the position information of the image of step (d) and then performing spotting; and (f) repeatedly performing step (d) to step (e) until all spotting is completed.

REFERENCES:
patent: 6453243 (2002-09-01), Watanabe et al.
patent: 6589778 (2003-07-01), Hawkins
patent: 6646271 (2003-11-01), Yokokawa et al.
patent: 6673315 (2004-01-01), Sheridan et al.
patent: 6902897 (2005-06-01), Tweedie et al.
patent: 2004/0241667 (2004-12-01), Chesk et al.

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