Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1981-07-08
1984-01-10
Punter, William H.
Optics: measuring and testing
By polarized light examination
With light attenuation
250578, 356387, 356390, G01B 1100, G01B 1114, G01B 1108
Patent
active
044250428
ABSTRACT:
A portion of a collimated light beam is directed at an article, and the resultant shadow-containing beam is reflected by a mirror onto a linear photodiode array. A second portion of the collimated beam is initially reflected by the mirror toward the article. The resultant shadow-containing beam impinges upon a second portion of the diode array. The positions of the two shadows on the array are indicative of the X and Y positions of the article. The scanned output from the array is processed to generate two binary signals representative of the X and Y positions.
REFERENCES:
patent: 3874798 (1975-04-01), Antonsson et al.
patent: 4201476 (1980-05-01), Musto et al.
Khoury, H. A., "Linear Photodiode Feedback Automatic Alignment System", IBM Tech. Disc. Bull. 3/75, pp. 2887-2889.
Rycroft, R. J., "A Non-Contacting Width Monitor & A Position Sensitive Photocell", Colloquium on Optical Techniques for Measurement in Control, London, England, Oct. 26, 1970, pp. 5/1-4.
Gusev, Y. A., "Method & Circuit for Finding the Coordinate of the Center of a Particle Track on a Scanning Automation", Instruments & Experimental Techniques, Nov.-Dec. 1975, pp. 1761-1763.
Corning Glass Works
Punter William H.
Simmons, Jr. W. J.
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