Positioning measurement apparatus and method

Details Positioning measurement apparatus and method Positioning measurement apparatus and method

2011-06-14

2011-06-14

Carter, Aaron W (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S209000, C382S216000

Reexamination Certificate

active

07961931

ABSTRACT:
A positioning measurement method is provided. The method includes the step of: capturing images of a standard object and to-be-measured objects; selecting one or more standard points from the image of the standard object; selecting a general location area and a standard area by taking each standard point as a reference point; generating a script for recording positions of each general location area and capturing a standard image in each standard area; storing the script into the data storage; determining the position of the general location area on the image of the to-be-measured object according to the position of general location area recorded in the script; and determining a measurement area, the image in the measurement area is most similar to the standard image within the general location area.

REFERENCES:
patent: 5067162 (1991-11-01), Driscoll et al.
patent: 5750990 (1998-05-01), Mizuno
patent: 5956419 (1999-09-01), Kopec et al.
patent: 6009212 (1999-12-01), Miller et al.
patent: 6408107 (2002-06-01), Miller et al.
patent: 6411731 (2002-06-01), Saito
patent: 6553152 (2003-04-01), Miller et al.
patent: 6633686 (2003-10-01), Bakircioglu et al.
patent: 6915003 (2005-07-01), Oosawa
patent: 6968084 (2005-11-01), Satoh
patent: 7146347 (2006-12-01), Vazquez et al.
patent: 7173268 (2007-02-01), Tanaka
patent: 7454065 (2008-11-01), Satoh
patent: 2003/0152275 (2003-08-01), Chung et al.
patent: 2003/0185446 (2003-10-01), Huang et al.
patent: 2003/0185447 (2003-10-01), Huang et al.
patent: 2003/0185462 (2003-10-01), Hsieh
patent: 2005/0002070 (2005-01-01), Nakaya et al.
patent: 2005/0207636 (2005-09-01), Liu et al.
patent: 2006/0038986 (2006-02-01), Honda et al.
patent: 2006/0045350 (2006-03-01), Itoh et al.
patent: 2006/0066649 (2006-03-01), Hirashima et al.
patent: 2006/0164682 (2006-07-01), Lev
patent: 2007/0019842 (2007-01-01), Kang
patent: 2007/0248258 (2007-10-01), Mitsui
patent: 2009/0226076 (2009-09-01), Sakai et al.
patent: 2009/0268959 (2009-10-01), Harada et al.
patent: 2010/0149322 (2010-06-01), Lev
patent: 10103922 (1998-04-01), None

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