Positioning apparatus and process system having the same

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414331, 414225, 414783, 356372, 356373, 356376, B65H 100, G01B 1124

Patent

active

057400342

ABSTRACT:
A semiconductor wafer positioner including a rotating table on which a wafer is placed and a peripheral shape of the wafer is optically detected as a first peripheral shape signal. A control section combines two half cycle components of the first peripheral shape signal, the components being 180.degree. out of phase, to obtain a second peripheral shape signal exhibiting a characteristic feature of flat orientation. A peak in the second peripheral shape signal is detected, and data in the first peripheral shape signal corresponding to the peak and 180.degree. from the peak is invalidated. A curve approximation is utilized to approximate the invalidated data to produce a third peripheral shape signal from which an eccentricity amount and direction are calculated.

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patent: 5239182 (1993-08-01), Tateyama et al.
patent: 5289263 (1994-02-01), Kiyokawa et al.
patent: 5493403 (1996-02-01), Nishi

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