Positional measurement system and lens for positional...

Details Positional measurement system and lens for positional... Positional measurement system and lens for positional...

2004-09-15

2009-06-30

Toatley, Jr., Gregory J (Department: 2877)

Optics: measuring and testing

Position or displacement

C356S003000, C250S342000, C250S559290, C342S357490, C342S450000, C359S726000, C359S727000

Reexamination Certificate

active

07554676

ABSTRACT:
A positional measurement system includes an electromagnetic wave source which emits an electromagnetic wave, a lens system which has a first lens surface, an electromagnetic wave shield section provided around a center axis of the first lens surface, and a second lens surface, and causes the electromagnetic wave having entered by way of the first lens surface exclusive of the electromagnetic wave shield section to exit from the second lens surface, to form an electromagnetic wave concentrated area at a position opposite the electromagnetic wave source, a receiving device which detects the electromagnetic wave concentrated area formed by the lens system, and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area.

REFERENCES:
patent: 2444770 (1948-07-01), Fyler
patent: 2520635 (1950-08-01), Grey
patent: 2748658 (1956-06-01), Bouwers
patent: 3026413 (1962-03-01), Taylor
patent: 3353022 (1967-11-01), Schwartz
patent: 3438695 (1969-04-01), Matsui
patent: 3474242 (1969-10-01), Forrant
patent: 3853405 (1974-12-01), Adler et al.
patent: 4106855 (1978-08-01), Coon
patent: 4554448 (1985-11-01), Sillitto
patent: 4801202 (1989-01-01), Wilcox
patent: 4912334 (1990-03-01), Anderson
patent: 5555207 (1996-09-01), Barker
patent: 5793538 (1998-08-01), Cameron et al.
patent: 5821526 (1998-10-01), Krishna
patent: 6097550 (2000-08-01), Kimura
patent: 6169637 (2001-01-01), Tsunashima
patent: 6788210 (2004-09-01), Huang et al.
patent: 7009713 (2006-03-01), Seko et al.
patent: 7435940 (2008-10-01), Eliasson et al.
patent: 7442914 (2008-10-01), Eliasson et al.
patent: 2001/0006434 (2001-07-01), Yoo et al.
patent: 2002/0097505 (2002-07-01), DeLong
patent: 2004/0051880 (2004-03-01), Seko et al.
patent: 56028503 (1981-03-01), None
patent: 62-000880 (1987-01-01), None
patent: 02-013798 (1990-01-01), None
patent: 4-062491 (1992-02-01), None
patent: 4-315974 (1992-11-01), None
patent: 4-315982 (1992-11-01), None
patent: 6-042919 (1994-02-01), None
patent: 7-325096 (1995-12-01), None
patent: 11-074844 (1999-03-01), None
patent: 2000-171209 (2000-06-01), None
patent: 2000-339746 (2000-12-01), None
patent: 2004-212328 (2004-07-01), None
Yasuji Seko, New Light Measurement “Light Interference Lens Method”, the Sixty-Third Joint Symposium related to Applied Physics Abstracts Book, p. 871, 24p-ZN-7, Japan Society of Applied Physics (Sep. 2002).

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