Measuring and testing – Testing of apparatus
Patent
1996-08-15
1997-09-16
Noland, Thomas P.
Measuring and testing
Testing of apparatus
356375, 3242072, 32420721, G01D 516, G01D 520, G01D 526, G01B 2100
Patent
active
056683316
ABSTRACT:
The invention relates to a position sensor including at least two sensor units which measure in a contactless manner a position x of an element which is movably arranged relative to the sensor units. Using limited circuitry, the invention precludes sources of errors during the processing of the sensor signals in that from the sensor signals there is formed a measuring signal from the phase position of which relative to the clock signal there can be determined the position x. The position x may be, for example an angle or a length position.
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Patent Abstracts of Japan copyright 1995 (7-49669) dated Feb. 21, 1995 "Method for Detecting Coordinate Position of Matrix Panel".
Schintag Peter
Suwald Thomas
Marion Michael E.
Noland Thomas P.
U.S. Philips Corporation
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