Position-sensitive X-ray analysis

Details Position-sensitive X-ray analysis Position-sensitive X-ray analysis

1994-08-08

1995-08-29

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 55, 378 79, G01N 2302

Patent

active

054467772

ABSTRACT:
For position-sensitive measurements, an X-ray analysis system comprises a one-dimensional position-sensitive detector and a detection Soller slit system in order to achieve position sensitivity in a direction transversely of the dispersion direction of the detector. Different position-sensitive measurement methods can be carried out by adaptation of the Soller slit system and the orientation of the one-dimensional position-sensitive detector.

REFERENCES:
patent: 2853618 (1958-09-01), De Marco et al.
patent: 3428802 (1969-02-01), Mehta et al.
patent: 4076981 (1978-02-01), Sparks et al.
patent: 4910758 (1990-03-01), Herrick
patent: 5268953 (1993-12-01), Van Vlijmen

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