Position measuring system using two groups of magnetoresistors s

Details Position measuring system using two groups of magnetoresistors s Position measuring system using two groups of magnetoresistors s

1994-05-06

1995-07-04

Snow, Walter E.

Electricity: measuring and testing

Magnetic

Displacement

32420724, 338 32R, G01B 714, G01R 3302, H03K 1790, H03K 1918

Patent

active

054303745

ABSTRACT:
In a position measuring system a period graduation is scanned by a scanning unit using two groups of respectively four magneto-resistive elements. To avoid crossings of the connecting strip conductors of the magneto-resistive elements and short-wave interference effects on the measuring accuracy, the magneto-resistive elements of the first group extend over one index period of the graduation at a mutual separation of t/4, while every magneto-resistive element of the second group is disposed in adjoining index periods of the graduation at a mutual separation of 3/4(t). Starting at the center of both groups, the respectively Nth magneto-resistive element of the first group is connected to the Nth magneto-resistive element of the second group free of crossings.

REFERENCES:
patent: 4806860 (1989-02-01), Iijima et al.
patent: 5036276 (1991-07-01), Aizawa
patent: 5243280 (1993-09-01), Kusumi
Patent Abstracts of Japan, P-493, vol. 10/No. 256, Sep. 2, 1986.

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