Position measuring system

Geometrical instruments – Area integrators – Electrical

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250237G, G01B 1104

Patent

active

046024360

ABSTRACT:
In a position measuring system for measuring the relative position of two objects, a scale having a graduation with a graduation period P is scanned by a scanning unit in order to generate a periodic analog signal having a bandwidth N. In order to generate harmonic-free Fourier coefficients of the fundamental wave of the periodic analog signal, a scanning plate included in the scanning unit includes a first scanning group with first and second scanning fields as well as a second scanning group with first and second scanning fields. The first scanning group is offset with respect to the second scanning group by P/4. The first scanning fields are offset with respect to the second scanning fields by P/2. Each scanning field includes N partial fields which are offset with respect to one another by P/2N in the measuring direction. The widths of the partial fields are varied in the measuring direction according to a sine function. To each scanning field there is allocated a scanning element, and the scanning elements of the second scanning fields are connected in difference of those of the first scanning fields. The scanning elements are connected to an evaluating arrangement for the formation of position measuring values.

REFERENCES:
patent: 3578979 (1971-05-01), Kawaguchi et al.
patent: 3713139 (1973-01-01), Sanford et al.
patent: 4078173 (1978-03-01), Fultz
patent: 4225931 (1980-09-01), Schwefel
patent: 4477189 (1984-10-01), Ernst
patent: 4519709 (1985-05-01), Nelle

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