Position measuring system

Details Position measuring system Position measuring system

2005-09-13

2005-09-13

Porta, David (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

C250S231160

Reexamination Certificate

active

06943341

ABSTRACT:
A position measuring system that includes a scale having an incremental graduation track of a defined incremental graduation period and on at least one defined reference position, a reference marking field with a mean reference marking graduation period. A scanning unit movable with respect to the scale, the scanning unit having a plurality of scanning elements for generating scanning signals, wherein at least two phase-shifted incremental signals are generated as scanning signals. A first evaluation device that determines a rough reference position. A second evaluation device that determines a beat signal phase. A third evaluation device, which is suitable for unequivocally marking a beat signal period from the rough reference position and, if a defined phase position exists, to issue a fine reference position from the beat signal phase.

REFERENCES:
patent: 3985448 (1976-10-01), Wiklund et al.
patent: 4263506 (1981-04-01), Epstein
patent: 4866269 (1989-09-01), Wlodarczyk et al.
patent: 4882479 (1989-11-01), Hino
patent: 35 36 466 (1987-04-01), None
patent: WO 02/23131 (2002-03-01), None
Pending U.S. Appl. No. 10/380,847, Inventors: Holzapfel et al., filed Sep. 24, 2003.

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