Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2011-01-25
2011-01-25
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C250S231160
Reexamination Certificate
active
07876451
ABSTRACT:
A position-measuring device includes a light source, a first grating, a second grating and photodetectors, light from the light source, which is split into partial beams of different directions at the first and second grating, being directed via a deflecting element to the detector. The deflecting element for incident partial beams having different directions has different regions, so that all partial beams directed from the deflecting element to the detector are approximately parallel.
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patent: 5812320 (1998-09-01), Maeda
patent: 0 163 362 (1985-12-01), None
patent: WO 2007/034379 (2007-03-01), None
Connolly Patrick J
Dr Johannes Heidenhain GmbH
Kenyon & Kenyon LLP
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