Position-marking method for a machine that measures in three dim

Details Position-marking method for a machine that measures in three dim Position-marking method for a machine that measures in three dim

1994-09-19

1996-06-18

Gordon, Paul P.

Boots, shoes, and leggings

36447428, 36416701, 31856816, 395 86, G06F 1900, G05B 1918

Patent

active

055285058

ABSTRACT:
The contact sensor of the hinged arm of a measurement machine for taking measurements in three dimensions is replaced by a light sensor secured at the same position. A first position-marking axis defined by a light beam emitted by an emitter disposed in a first position is used to determine a first vector by two measured points. The emitter is moved in a plane so as to take up a second position, and a second position-marking axis defined by the light beam of said emitter is used by measuring a point on the second axis. The projection [O.sub.1 ] of the second axis point onto the first position-marking axis is then used to enable a frame of reference [O.sub.1 X, O.sub.1 Y, O.sub.1 Z] to be established. If the machine needs to be displaced in order to take measurements in a zone that is further away, a new frame of reference is determined using the same steps, using the same first axis and using a new point on another second axis that is obtained by a new displacement of the emitter performed so that it remains in the same plane, thereby enabling the origin [O.sub.2 ] of the new frame of reference to be determined, thus making it possible to make available a plurality of known frames of reference.

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Proceedings 1987 IEEE International Conference on Robotics and Automation, vol. 2, Apr. 1987, Raleigh, North Carolina, USA pp. 807-815 C. H. Chen, A. C. KAK, `Modeling and calibration of a structured light scanner for 3-D robot vision`.

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