Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-03-06
1999-05-04
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
25055934, 356385, G01B 1100
Patent
active
059009403
ABSTRACT:
A method and apparatus for accurately determining the location of a component picked up by a pickup device for facilitating accurate mounting of the component. The method employs an arrangement wherein diffusion-type light sources can be employed and the coordinates of the corners of the component are determined by measuring the shifting of the shadow of the component on a receptor by illuminating the light sources in sequence. In some instances, the accuracy of the measurement can be improved by rotating the component this being particularly useful if the component has a shape that deviates greatly from a square shape.
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patent: 5467186 (1995-11-01), Indo et al.
patent: 5559727 (1996-09-01), Deley et al.
patent: 5570993 (1996-11-01), Onodera et al.
patent: 5619528 (1997-04-01), Sakurai
Pham Hoa Q.
Yamaha Hatsudoki Kabushiki Kaisha
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