Position detection technique

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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Details

C382S218000, C382S280000

Reexamination Certificate

active

07418125

ABSTRACT:
An apparatus for detecting a position of a region, corresponding to a mark, in image data, as a mark position, the mark including periodically arranged patterns. A first unit obtains a real-space energy distribution which corresponds to an energy spectrum distribution of each partial area of the image data. A probability distribution obtaining unit obtains a probability distribution based on the real-space energy distribution, the probability distribution indicating repetitive positions of the periodically arranged patterns and the intensity of periodicity at this position. A second unit obtains a degree of correlation between each probability distribution obtained by the probability distribution obtaining unit and a pre-registered probability distribution of the mark, and a third unit obtains the mark position based upon the degrees of correlation obtained by the second unit.

REFERENCES:
patent: 5841520 (1998-11-01), Taniguchi
patent: 6101267 (2000-08-01), Shiraishi
patent: 6225639 (2001-05-01), Adams et al.
patent: 6333786 (2001-12-01), Uzawa et al.
patent: 6559953 (2003-05-01), Davids
patent: 6937397 (2005-08-01), Okuno et al.
patent: 7039889 (2006-05-01), Takahashi et al.
patent: 7181057 (2007-02-01), Adel et al.
patent: 2001-195583 (2001-07-01), None

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