Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-02-06
1998-07-21
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356373, 3561522, 369 4414, G01B 1114
Patent
active
057841683
ABSTRACT:
A position detection system (80) is described for detecting movements of an object (20) in at least five degrees of freedom, which system comprises a radiation source (33), a beam splitter (36) for forming a first measuring sub-beam (45) and a second measuring sub-beam (50), a reflector (38) arranged in the path of one of these measuring beams (45, 50) and a composite radiation-sensitive detection system (60). The first measuring sub-beam (45) is used for detecting displacements along three mutually perpendicular axes (X, Y, Z), and the second measuring sub-beam (50) is used for detecting rotations about at least two of these axes.
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patent: 4832496 (1989-05-01), Thomas
patent: 4880992 (1989-11-01), Niedermayr et al.
patent: 5661704 (1997-08-01), Wan Rosmalen
"A Compact Optical Tape Recording System", G.E. Van Rosmalen, J.A.H. Kahlman, P.L.M. Put and C.M.J. Van Uijen, SPIE vol. 2338, Optical Data Storage, 1994, pp. 8-14.
Ophey Willem G.
van Rosmalen Gerard E.
Belk Michael E.
Pham Hoa Q.
U.S. Philips Corporation
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