Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement
Reexamination Certificate
2006-12-25
2011-10-04
Dunn, Drew A (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Position measurement
Reexamination Certificate
active
08032320
ABSTRACT:
A position detection system and method in which the accuracy of position measurement of a device is not decreased with changes in the resonant frequency. The system includes a device having a magnetic induction coil; a driving coil generating an alternating magnetic field, applied to the magnetic induction coil, having a position-calculating frequency in the vicinity of a resonant frequency of the magnetic induction coil; a plurality of magnetic sensors that detects an induced magnetic field generated by the magnetic induction coil; a measurement-reference-value calculating section determining a measurement reference value at the position-calculating frequency when only the alternating magnetic field is applied; a position-analyzing section calculating at least one of the position and orientation of the device and the measurement reference value when the alternating magnetic field and the induced magnetic field are applied; and a redetermining section redetermining the position-calculating frequency at a predetermined timing.
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patent: 2003/0229268 (2003-12-01), Uchiyama et al.
patent: 2005-40342 (2005-02-01), None
patent: 2006-271520 (2006-10-01), None
patent: WO 2004/014225 (2004-02-01), None
patent: WO 2005/120345 (2005-12-01), None
Kimura Atsushi
Sato Ryoji
Uchiyama Akio
Dunn Drew A
Olympus Corporation
Scully , Scott, Murphy & Presser, P.C.
Sun Xiuquin
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