Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate
2005-03-22
2005-03-22
Smith, Zandra V. (Department: 2877)
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
Reexamination Certificate
active
06870623
ABSTRACT:
A position detection apparatus for detecting a position of a pattern includes a first sensing system which senses a first image of the pattern at a first magnification, a second sensing system which senses a second image of the pattern at a second magnification higher than the first magnification, and a determination system which determines whether a relative position between the second sensing system and the pattern is valid for detecting a position of the pattern based on the first image sensed by the first sensing system.
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Mishima Kazuhiko
Tanaka Hiroshi
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