Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1997-06-26
2000-11-28
Kim, Robert H.
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
356399, G01N 1100
Patent
active
061542814
ABSTRACT:
A position detecting system for detecting relative position of a first object and a second object having first and second physical optic elements, respectively, includes a light projecting system for projecting light to one of the first and second physical optic elements, wherein light from the one physical optic element illuminated with the light from the light projecting system is projected to the other of the first and second physical optic elements, and a light receiving system for receiving light from the other physical optic element illuminated with the light from the one physical optic element, wherein relative position of the first and second objects can be detected by detecting positional information related to a position of the thus received light upon a predetermined plane, wherein the light projecting system serves to project lights of different wavelengths on to the one physical optic element in different states of convergence or divergence.
REFERENCES:
patent: 4037969 (1977-07-01), Feldman et al.
patent: 4311389 (1982-01-01), Fay et al.
patent: 4856905 (1989-08-01), Nishi
patent: 4938598 (1990-07-01), Akiyama et al.
patent: 5114236 (1992-05-01), Matsugu et al.
patent: 5196711 (1993-03-01), Matsugu et al.
patent: 5200800 (1993-04-01), Suda et al.
patent: 5285259 (1994-02-01), Saitoh
patent: 5313272 (1994-05-01), Nose et al.
patent: 5333050 (1994-07-01), Nose et al.
patent: 5369486 (1994-11-01), Matsumoto et al.
patent: 5377009 (1994-12-01), Kitaoka et al.
patent: 5396335 (1995-03-01), Hasegawa et al.
patent: 5432603 (1995-07-01), Sentoku et al.
patent: 5455679 (1995-10-01), Houryu et al.
patent: 5465148 (1995-11-01), Matsumoto et al.
patent: 5481363 (1996-01-01), Matsugu et al.
patent: 5550635 (1996-08-01), Saitoh et al.
patent: 5585923 (1996-12-01), Nose et al.
patent: 5610718 (1997-03-01), Sentoku et al.
patent: 5625453 (1997-04-01), Matsumoto et al.
patent: 5682239 (1997-10-01), Matsumoto et al.
Saitoh Kenji
Sentoku Koichi
Canon Kabushiki Kaisha
Kim Robert H.
LandOfFree
Position detecting system and device manufacturing method using does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Position detecting system and device manufacturing method using , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Position detecting system and device manufacturing method using will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1731336