Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1995-02-06
1995-10-03
Limanek, Robert P.
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
356375, 250548, G01B 1127, G01N 2186
Patent
active
054556791
ABSTRACT:
A position detecting system includes a light source for producing a light beam for irradiating a reference mark formed on an object which is relatively displaceable relative to the light beam, a detector for detecting a light quantity distribution of the light from the reference mark, and a circuit for comparing a first light quantity distribution at a first position with a second light quantity distribution at a second position spaced from the first position by a predetermined distance, and for determining a reference position of the object on the basis of the comparison.
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Houryu Sakae
Saitoh Kenji
Canon Kabushiki Kaisha
Limanek Robert P.
Williams Alexander Oscar
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