Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1996-10-08
1999-08-24
Kim, Robert H.
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
356400, 250548, G01N 1100
Patent
active
059431350
ABSTRACT:
A position detecting method includes illuminating a mark having a step, by use of an illuminating system, detecting an image of the mark, by use of a position detecting optical system, calculating an evaluation value representing symmetry of the detected mark image, and adjusting a position of an effective light source of the illuminating system with respect to an optical axis of the position detecting optical system, on the basis of the evaluation value.
REFERENCES:
patent: 5686996 (1997-11-01), Fidler et al.
Canon Kabushiki Kaisha
Kim Robert H.
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