Optics: measuring and testing – Position or displacement
Reexamination Certificate
2006-12-05
2006-12-05
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
Position or displacement
C356S401000
Reexamination Certificate
active
07145666
ABSTRACT:
A position detecting method including steps of sensing an image of first and second marks, orthogonally transforming a signal obtained in the sensing step, and calculating each position of the first and second marks based on a phase of a corresponding frequency component obtained in the transform step. Patterns are disposed at a first interval in the first mark, patterns are disposed at a second interval in the second mark, and one of the first and second intervals is not an integer multiple of the other of the first and second intervals.
REFERENCES:
patent: 5231471 (1993-07-01), Torigoe
patent: 5585925 (1996-12-01), Sato et al.
patent: 5986766 (1999-11-01), Koga et al.
patent: 6091481 (2000-07-01), Mori
patent: 6333786 (2001-12-01), Uzawa et al.
patent: 6844918 (2005-01-01), Navarro Y Koren et al.
patent: 2003/0053040 (2003-03-01), Hayashi et al.
patent: 2005/0270509 (2005-12-01), Ogushi et al.
patent: 2006/0092420 (2006-05-01), Oishi
patent: 3-282715 (1991-12-01), None
patent: 10-284406 (1998-10-01), None
Fitzpatrick ,Cella, Harper & Scinto
Pham Hoa Q.
LandOfFree
Position detecting method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Position detecting method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Position detecting method and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3710361