Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-07-19
2011-07-19
Mehta, Bhavesh (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S103000, C382S141000, C382S145000, C356S401000
Reexamination Certificate
active
07983472
ABSTRACT:
A method detects a position of a mark based on an image signal of the mark. The method includes steps of obtaining a first position of the mark by performing a first process for the image signal, extracting plural feature values from the image signal based on the first position, and detecting the position of the mark by obtaining an offset value for the first position based on the plural feature values.
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Canon Kabushiki Kaisha
Mehta Bhavesh
Rossi Kimms & McDowell LLP
Zeilberger Daniel
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