Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1984-02-15
1986-08-26
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
250237G, 340347P, 33125A, G01B 1114
Patent
active
046079564
ABSTRACT:
A position detecting apparatus provided with a photosensor for optically detecting the scale pattern of an optical scale which moves together with the optical head of the optical disk instrument, and generating an analog signal which corresponds to a pitch of the scale graduation. The photosensor has a light receiving surface, whose width is half the pitch of the scale graduation, and the analog signal of the photosensor is converted to digital signals by means of an A/D converter the digital signals corresponding to a pluralty of level signal components of the analog signal. The digital data thus obtained are added or subtracted according to the moving direction of the optical head, thus enabling the position of the optical head to be detected.
REFERENCES:
patent: 4135086 (1979-01-01), Baba
patent: 4409479 (1983-10-01), Sprague et al.
Patent Abstracts of Japan, vol. 2, No. 130, Oct. 28, 1978, p. 7957 E 78.
Roberts, Machine Design, vol. 50, No. 1, Jan. 1978, pp. 104-109.
Ishihara Atsushi
Yoshimaru Tomohisa
Evans F. L.
Tokyo Shibaura Denki Kabushiki Kaisha
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