Thermal measuring and testing – Heat flux measurement
Patent
1985-02-25
1986-05-20
Frankfort, Charles
Thermal measuring and testing
Heat flux measurement
374 30, 374208, 136221, 136230, G01K 1708, G01K 1720
Patent
active
045897816
ABSTRACT:
In the preferred and illustrated embodiment, multiple fixtures are set forth which function as support structures for thermal fluxmeters. A fluxmeter wafer or pad having top and lower faces and forming an output signal by means of thermopiles connected to both faces is used. It is supported by first and second alternate forms of fixtures. A force is applied to the fluxmeter wafer which is approximately normalized in both fixtures. This establishes a stabilized contact force against a surface to measure heat loss through the surface. This avoids variations in surface contact.
REFERENCES:
patent: 1528383 (1925-03-01), Schmidt
patent: 1942519 (1934-01-01), Packard
patent: 1977340 (1934-10-01), King
patent: 2022515 (1935-11-01), Orchard
patent: 3228241 (1966-01-01), Hullinger
patent: 3282107 (1966-11-01), Ekstrom
patent: 3296857 (1967-01-01), Kaczeus
patent: 3385105 (1968-05-01), Smith
patent: 3573995 (1971-04-01), Senbokuya
patent: 4265117 (1981-05-01), Thoma et al.
patent: 4470297 (1984-09-01), Ruhl
Barrow M. W.
Frankfort Charles
The Dow Chemical Company
Will Thomas B.
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