Portable gauge for measuring thickness variations of thin plasti

Details Portable gauge for measuring thickness variations of thin plasti Portable gauge for measuring thickness variations of thin plasti

1989-11-17

1991-07-09

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324674, 324687, 324690, G01R 2726

Patent

active

050309188

ABSTRACT:
A capacitance gauge system is described for determining the thickness of thin-film non-conducting material (i.e. polyethylene, vinyl, etc.). An elongated capacitance sensing head is applied to one side of the material being measured thereby disturbing the electric field produced by the head. Internal circuitry monitors the effect of the material under test and produces an output proportional to the variation in the material's thickness. A new method of resolving capacitance changes results in the ability to resolve capacitance changes on the order of 5.times.10.sup.-17 Farads in a linear manner with the benefits of simplicity, excellent stability, low power requirement, and small physical size. These factors allow said apparatus to be incorporated into a small hand-held unit. Because of this advancement in portability, accurate measurements can be made more quickly and conveniently than previously possible.

REFERENCES:
patent: 4103226 (1978-07-01), Fromson et al.
patent: 4482860 (1984-11-01), Risko
patent: 4588943 (1986-05-01), Hirth
patent: 4820972 (1989-04-01), Scott et al.
patent: 4841224 (1989-06-01), Chalupnik et al.

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