Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1992-12-16
1994-05-31
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
25023116, 356345, G01B 902
Patent
active
053173856
ABSTRACT:
A portable extended life metrology system is disclosed. The system is of the kind which includes means for generating an interference fringe pattern as a function of a parameter to be measured, transducer apparatus for simultaneously generating three intensity-modulated optical signals, I.sub.R, I.sub.S and I.sub.T that are related to the interference fringe pattern; signal processing apparatus for accurately determining an aspect of the interference fringe pattern form the three signals; means for accumulating phase information proportional to the aspect of the interference fringe pattern; and means for converting the accumulated phase and aspect information to desired outputs indicative of the parameter to be measured. The system includes a pulsed drive circuit designed to minimize its power drain without affecting its measurement accuracy and an energy source connected by the pulsed drive circuit to a radiation source to power the same in two operative states: a low, standby mode and a higher operational mode, with incremental and self-adaptive switching therebetween. The pulsed drive circuit controls the energy per pulse, the pulse repetition rate, and returns residual energy to the energy source of the system.
REFERENCES:
patent: 3523735 (1970-08-01), Taylor
patent: 4631416 (1986-12-01), Trutna, Jr.
patent: 4676645 (1987-06-01), Taniguchi et al.
patent: 4710026 (1987-12-01), Magone et al.
patent: 4728193 (1988-03-01), Bartelt et al.
patent: 4764014 (1988-08-01), Makosch et al.
patent: 4776698 (1988-10-01), Crosdale
patent: 4776701 (1988-10-01), Pettigrew
patent: 4815850 (1989-03-01), Kanayama et al.
patent: 4815854 (1989-03-01), Tanaka et al.
patent: 5098190 (1992-03-01), Wijntjes
Lawrence Mertz "Complex interferometry" Applied Optics, vol. 22, No. 10, May 15, 1983, pp. 1530-1533.
M. Hercher, Geert Wyntjes "Proceedings of SPIE-The International Society" Design of Optical Systems Proceedings of SPIE vol. 741, Jan. 1987, pp. 174-184.
Silva John R.
Wyntjes Geert J.
Federal Products Corporation
Rashid Peter J.
Turner Samuel A.
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