Optics: measuring and testing – By light interference – Having partially reflecting plates in series
Reexamination Certificate
2005-05-24
2005-05-24
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
By light interference
Having partially reflecting plates in series
Reexamination Certificate
active
06897965
ABSTRACT:
The measurement of the wavelength shifts in the reflectometric interference spectra of a porous semiconductor substrate such as silicon, make possible the highly sensitive detection, identification and quantification of small analyte molecules. The sensor of the subject invention is effective in detecting multiple layers of biomolecular interactions, termed “cascade sensing”, including sensitive detection of small molecule recognition events that take place relatively far from the semiconductor surface.
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Dancil Keiki-Pua S.
Ghadiri M. Reza
Lin Shang-Yi
Motesharei Kianoush
Sailor Michael J.
The Regents of the University of California at San Diego
The Scripps Research Institute
Turner Samuel A.
Welsh & Katz Ltd.
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