Chemistry of inorganic compounds – Zeolite – Structure defined x-ray diffraction pattern
Reexamination Certificate
2006-03-07
2006-03-07
Sample, David (Department: 1755)
Chemistry of inorganic compounds
Zeolite
Structure defined x-ray diffraction pattern
C423S706000, C423S708000, C423S329100, C423S594900, C423S618000
Reexamination Certificate
active
07008612
ABSTRACT:
The invention relates to a porous crystalline material which, in the calcined state, has a composition: X2O3:nYO2:mZO2, wherein: X represents a trivalent element; Z represents Ge; and Y represents at least one tetravalent element other than Ge. Furthermore, in the chemical composition, (n+m) is equal to at least 5 and the Y/Z ratio is equal to at least 1. Moreover, in the calcined state, said material has an X-ray diffraction pattern which coincides substantially with (1), wherein VS is a very strong relative intensity corresponding to a percentage of between 80 and 100 with respect to the most intense peak; M is a mean relative intensity corresponding to a percentage of between 40 and 60 with respect to the most intense peak; and W is a mean relative intensity corresponding to a percentage of between 20 and 40 with respect to the most intense peak.
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Lobo, R.F. et al; Synthesis and characterization of pure-silica and boron-substituted SSZ-24 using N(16) methylsparteinium bromide as structure-directing agent; Microporous Meterials 3(1994), pp. 61-69.
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Cabañas María José Díaz
Canós Avelino Corma
García Fernando Rey
Consejo Superior de Investigaciones Cientificas
Klauber & Jackson
Sample David
Universidad Politecnica de Valencia
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