Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-06-13
2006-06-13
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C702S067000, C702S073000
Reexamination Certificate
active
07062393
ABSTRACT:
A method for determining the amount of deterministic jitter and random jitter in a digital signal having transitions between logical levels, the method comprising the steps of: providing said digital signal, determining a plurality of bit error rate values, each bit error rate value being associated with one of a plurality of successive timing points, and each bit error rate value being derived from a comparison of a result of a detection of a transition occurring in the digital signal cumulatively prior to its associated timing point with an expected signal, applying a polynomial fit in time to said plurality of bit error rate values associated with said timing points for determining a number of polynomial coefficients of said polynomial fit, and deriving the amount each of said deterministic and said random jitter from said polynomial coefficients.
REFERENCES:
patent: 6167359 (2000-12-01), Demir et al.
patent: 6298315 (2001-10-01), Li et al.
patent: 6597727 (2003-07-01), Philips et al.
patent: 6782404 (2004-08-01), Choudhary
T11.2/Project 1316-DT/REV 10.0: “Fibre Channel—Methodologies for Jitter and Signal Quality Specification—MJSQ” Secretariat International Committee For Information Technology Standardization, Mar. 10, 2003, XP002260650, Washington, DC, Entire Document.
Leclerc O et al, “Synchronously Modulated 1-15 Solution Systems: A Simple Analysis of Timing-Jitter Statistics and Bit Error Rate” OFC, 1998, Washington, DC, ISBN: 1-55752-521-8, pp. 290-291.
Agilent Technologie,s Inc.
Hoff Marc S.
Suarez Felix
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