Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2007-10-23
2007-10-23
Vinh, Lan (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S595000, C438S689000, C438S725000, C438S780000, C204S192100
Reexamination Certificate
active
11127175
ABSTRACT:
A method includes forming a group of first structures on a semiconductor device and forming spacers adjacent side surfaces of each of the first structures to form a group of second structures. The method further includes using the group of second structures to form at least one sub-lithographic opening in a material layer located below the group of second structures.
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2002 IEEE International Solid-State Circuits Conference, Session 6, “SRAM and Non-Volatile Memories,” Feb. 4, 2004, 6 pages.
2002 IEEE International Solid-State Circuits Conference, 23 pages.
Bell Scott A.
Hui Angela T.
Jones Phillip Lawrence
Advanced Micro Devices , Inc.
Dahimene Mahmoud
Harrity & Snyder LLP
Vinh Lan
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