Polycrystalline X-ray spectrometer

Details Polycrystalline X-ray spectrometer Polycrystalline X-ray spectrometer

1986-11-10

1989-01-03

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 45, 378 75, 378 85, 378 83, G01N 2320, G01N 2322

Patent

active

047962844

ABSTRACT:
A wavelength dispersive X-ray spectrometer is provided with a polycrystalline analyzer for analyzing characteristic spectra of a sample. The polycrystalline analyzer provides a multiple spectrum of characteristic lines which are separated by appropriate pulse height analysis. Each of these sets of characteristic lines of the elements of the sample are provided at different dispersion and wavelength ranges.

REFERENCES:
patent: 3424428 (1969-01-01), Canon
patent: 3806726 (1974-04-01), Ishijima
patent: 4472825 (1984-09-01), Jenkins
Jenkins, R., "Combination of the Energy Dispersion Spectrometer with the Powder Diffractometer," Norelco Reporter, vol. 20, No. 3, Dec. 1973, pp. 22-30.

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