Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2011-08-09
2011-08-09
Sheikh, Humera (Department: 1789)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
C438S693000, C216S089000, C252S079100
Reexamination Certificate
active
07994058
ABSTRACT:
The present invention relates to polishing slurry and polishing method used for polishing in a process for forming wirings of a semiconductor device, and the like. There are provided polishing slurry giving a polished surface having high flatness even if the polished surface is made of two or more substances, and further, capable of suppressing metal residue and scratches after polishing, and a method of chemical mechanical polishing using this. The polishing slurry of the present invention is polishing slurry containing at least one of a surfactant and an organic solvent, and a metal oxide dissolving agent and water, or polishing slurry containing water and abrasive, wherein the surface of the abrasive is modified with an alkyl group, and preferably, it further contains a metal oxidizer, water-soluble polymer, and metal inhibitor.
REFERENCES:
patent: 4944836 (1990-07-01), Beyer et al.
patent: 5502251 (1996-03-01), Pohmer et al.
patent: 6001730 (1999-12-01), Farkas et al.
patent: 6022400 (2000-02-01), Izumi et al.
patent: 6046110 (2000-04-01), Hirabayashi et al.
patent: 6432824 (2002-08-01), Yanagisawa
patent: 6432828 (2002-08-01), Kaufman et al.
patent: 6547843 (2003-04-01), Shimazu et al.
patent: 6555510 (2003-04-01), Lamanna et al.
patent: 6720264 (2004-04-01), Sahota et al.
patent: 2001/0039766 (2001-11-01), Hattori et al.
patent: 2006/0216939 (2006-09-01), Uchida et al.
patent: 0 371 147 (1990-06-01), None
patent: 02-278822 (1990-11-01), None
patent: 05-112775 (1993-05-01), None
patent: 6-124946 (1994-05-01), None
patent: 08-083780 (1996-03-01), None
patent: 09-055363 (1997-02-01), None
patent: 2819196 (1998-08-01), None
patent: 11-033896 (1999-02-01), None
patent: 2000-53946 (2000-02-01), None
patent: 2000-144109 (2000-05-01), None
patent: 2001-064631 (2001-03-01), None
patent: 2001-135601 (2001-05-01), None
patent: 2001-144060 (2001-05-01), None
patent: 2001-189295 (2001-07-01), None
patent: 2001-269859 (2001-10-01), None
patent: 2001-269860 (2001-10-01), None
patent: 2001-316691 (2001-11-01), None
patent: 2002-121541 (2002-04-01), None
patent: 2004-534396 (2004-11-01), None
patent: WO 89/12082 (1989-12-01), None
patent: WO 99/47618 (1999-09-01), None
patent: WO 00/00561 (2000-01-01), None
patent: WO 00/39844 (2000-07-01), None
patent: 01/04226 (2001-01-01), None
patent: 01/33620 (2001-05-01), None
patent: WO 01/44402 (2001-06-01), None
patent: WO 01/57919 (2001-08-01), None
patent: 02/102910 (2002-12-01), None
Wijekoon et al. (Development of a production worthy copper CMP process;1998 IEEE Advanced Semiconductor Manufacturing Conference).
Japanese Office Action dated Jan. 8, 2008 (mailing date), issued in corresponding Japanese Patent Application No. 2003-541040.
Kaufman F. B. et al., “Chemical-Mechanical Polishing for Fabricating Patterned W Metal Features as Chip Interconnects”, Journal of Electrochemical Society, vol. 138, No. 11 (Nov. 1991) (The Electrochemical Society, Inc.), pp. 3460-3465.
Chinese Office Action dated Dec. 8, 2006, issued in corresponding Chinese Patent Application No. 028265513.
Japanese Office Action dated Sep. 25, 2007 (mailing date), issued in corresponding Japanese Patent Application No. 2003-541040.
Japanese Office Action dated Mar. 30, 2010, issued in corresponding Japanese Patent Application No. 2007-304888.
Japanese Office Action dated Dec. 15, 2010, issued in corresponding Japanese Patent Application No. 2010-14423.
Japanese Office Action dated Mar. 22, 2011, issuerd in corresponding Japanese Patent Application No. 2008-058740.
Amanokura Jin
Anzai Sou
Fukasawa Masato
Sakurada Takafumi
Sasaki Shouichi
George Patricia A
Hitachi Chemical Co. Ltd.
Sheikh Humera
Westerman Hattori Daniels & Adrian LLP
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