Abrading – Precision device or process - or with condition responsive... – By optical sensor
Reexamination Certificate
2011-04-19
2011-04-19
Morgan, Eileen P. (Department: 3723)
Abrading
Precision device or process - or with condition responsive...
By optical sensor
C451S041000, C451S526000, C451S527000
Reexamination Certificate
active
07927183
ABSTRACT:
A polishing pad provides excellent optical detection accuracy properties over a broad wavelength range (particularly at the short-wavelength side). A method for manufacturing a semiconductor device includes a process of polishing the surface of a semiconductor wafer with this polishing pad. The polishing pad has a polishing layer containing a polishing region and a light-transmitting region, wherein the light-transmitting region includes a polyurethane resin having an aromatic ring density of 2 wt % or less, and the light transmittance of the light-transmitting region is 30% or more in the overall range of wavelengths of 300 to 400 nm.
REFERENCES:
patent: 5436399 (1995-07-01), Koyama et al.
patent: 5605760 (1997-02-01), Roberts
patent: 5893796 (1999-04-01), Birang et al.
patent: 6832947 (2004-12-01), Manning
patent: 6855034 (2005-02-01), Hasegawa
patent: 6960120 (2005-11-01), Prasad
patent: 6984163 (2006-01-01), Roberts
patent: 7195539 (2007-03-01), Turner et al.
patent: 7226339 (2007-06-01), Benvegnu et al.
patent: 7238097 (2007-07-01), Ohno et al.
patent: 7306507 (2007-12-01), Benvegnu et al.
patent: 7435165 (2008-10-01), Prasad
patent: 2003/0171081 (2003-09-01), Komukai et al.
patent: 2004/0157534 (2004-08-01), Manning
patent: 2004/0224611 (2004-11-01), Aoi et al.
patent: 2005/0176912 (2005-08-01), Shin et al.
patent: 2005/0248881 (2005-11-01), Hayashida et al.
patent: 2006/0037699 (2006-02-01), Nakamori et al.
patent: 2007/0190905 (2007-08-01), Shimomura et al.
patent: 2008/0008971 (2008-01-01), Shiba et al.
patent: 1628138 (2005-06-01), None
patent: 0824995 (1998-02-01), None
patent: 6-206965 (1994-07-01), None
patent: 9-7985 (1997-01-01), None
patent: 10-83977 (1998-03-01), None
patent: 11-512977 (1999-11-01), None
patent: 2003-48151 (2003-02-01), None
patent: 3582790 (2004-08-01), None
patent: 2004-259728 (2004-09-01), None
patent: 2004-297061 (2004-10-01), None
patent: 2005-1059 (2005-01-01), None
patent: 2005-322790 (2005-11-01), None
patent: 2006-45523 (2006-02-01), None
patent: 2006-102940 (2006-04-01), None
patent: WO-2004/049417 (2004-06-01), None
patent: WO-2006/001518 (2006-01-01), None
International Search Report mailed Jun. 12, 2007 directed towards international application No. PCT/JP2007/059970; 4 pages.
Taiwanese Office Action and Search Report received Dec. 18, 2009, directed to counterpart Taiwanese Application No. 096117368; 9 pages.
Chinese Office Action mailed Jan. 22, 2010, directed to counterpart Chinese Application No. 2007800179946; 9 pages.
Chinese Office Action dated Aug. 11, 2010 directed towards counterpart application No. 200780017994.6; 6 pages.
Korean Office Action mailed Sep. 1, 2010, directed to KR-10-2008-7020466; 5 pages.
Fukuda Takeshi
Hirose Junji
Kimura Tsuyoshi
Nakai Yoshiyuki
Morgan Eileen P.
Morrison & Foerster / LLP
Toyo Tire & Rubber Co., Ltd.
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