Polishing pad

Abrading – Flexible-member tool – per se

Reexamination Certificate

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Reexamination Certificate

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11050722

ABSTRACT:
A single-layered polishing pad suitable for chemical mechanical polishing (CMP) of semiconductor wafers, etc., which attains excellent step height reduction and in-plane uniformity and is integrally molded by reaction injection molding, is provided. The polishing pad is a polyurethane-based foam12having a desired shape, as obtained by molding a gas-dissolved raw material having an inert gas dissolved under pressure in a polyurethane-base resin raw material by a reaction injection molding method, and includes a polishing region14having a polishing surface14asuitable for polishing semi-conductor materials, etc. and having a Shore D hardness in the range of from 40 to 80 and a stress reduction region16which is present in the side opposing to the polishing surface14aand which, when provided with a stress adjusting portion22of a desired pattern, is set up so as to have an amount of deflection, as applied with a load of 0.05 MPa, of 10 μm or more.

REFERENCES:
patent: 6358130 (2002-03-01), Freeman et al.
patent: 6361414 (2002-03-01), Ravkin et al.
patent: 6454634 (2002-09-01), James et al.
patent: 6544107 (2003-04-01), Misra et al.
patent: 6582283 (2003-06-01), James et al.
patent: 2002/0115385 (2002-08-01), Misra et al.
patent: 2005/0189235 (2005-09-01), Emami et al.
patent: 2005/0221723 (2005-10-01), Duboust et al.

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