Semiconductor device manufacturing: process – Chemical etching
Reexamination Certificate
2007-09-17
2011-10-04
Deo, Duy (Department: 1713)
Semiconductor device manufacturing: process
Chemical etching
C438S690000, C438S691000, C438S692000, C438S693000
Reexamination Certificate
active
08030213
ABSTRACT:
To provide a polishing technique with which in production of a semiconductor integrated circuit device, when a plane to be polished is polished, an appropriate polishing rate ratio of a polysilicon film to another material can be obtained, whereby high level planarization of a plane to be polished including a polysilicon film can be realized.A polishing compound for chemical mechanical polishing, containing cerium oxide particles, a water-soluble polyamine and water and having a pH within a range of from 10 to 13, is used.
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Kon Yoshinori
Yoshida Iori
AGC Seimi Chemical Co., Ltd.
Asahi Glass Company Limited
Deo Duy
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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