Polishing apparatus including separate retainer rings

Abrading – Precision device or process - or with condition responsive... – With feeding of tool or work holder

Reexamination Certificate

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Details

C451S041000, C451S287000, C451S288000, C451S398000

Reexamination Certificate

active

07662025

ABSTRACT:
A polishing apparatus includes a polishing pad for polishing a wafer and a polishing head for holding the wafer. The polishing head includes a retainer ring, a membrane sheet, and a head body. The retainer ring retains the wafer in a horizontal direction. The membrane sheet depresses the wafer to the polishing pad. The head body supports the retainer ring and the membrane sheet. The retainer ring includes a fixed retainer ring and a released retainer ring. The released retainer ring is interposed between the inner periphery of the fixed retainer ring and the periphery of the wafer to retain the wafer in the horizontal direction.

REFERENCES:
patent: 6224712 (2001-05-01), Ueno
patent: 6821192 (2004-11-01), Donohue
patent: 6964597 (2005-11-01), Khuu
patent: 6976908 (2005-12-01), Masunaga et al.
patent: 7056196 (2006-06-01), Numoto
patent: 2004/0018806 (2004-01-01), Numoto
patent: 2004/0142646 (2004-07-01), Chen et al.
patent: 2004/0171331 (2004-09-01), Maloney et al.
patent: 2005/0124269 (2005-06-01), Masunaga et al.
patent: 2006/0099893 (2006-05-01), Masunaga et al.
patent: 2007/0270089 (2007-11-01), Saito
patent: 2000-061824 (2000-02-01), None
patent: 2002-270551 (2002-09-01), None
patent: 2002-367941 (2002-12-01), None
patent: 2004-119495 (2004-04-01), None
patent: 2004-209613 (2004-07-01), None
patent: 2004-327547 (2004-11-01), None
patent: 2007-307623 (2007-11-01), None
Japanese Office Action dated Feb. 19, 2009 with Partial English Translation.
Japanese Office Action dated Sep. 29, 2008 with Partial English Translation.
Japanese Office Action dated Aug. 3, 2009 with Partial English Translation.

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