Abrading – Abrading process – Glass or stone abrading
Reexamination Certificate
2005-08-30
2005-08-30
Thomas, David B. (Department: 3723)
Abrading
Abrading process
Glass or stone abrading
C451S008000
Reexamination Certificate
active
06935930
ABSTRACT:
In a wafer polishing apparatus which polishes a wafer surface or in a wafer cleaner, there are provided a transfer and cleaning chamber which shuts off a wafer from the outside air and an inert gas supply device which fills an inert gas into the transfer and cleaning chamber. Thus, there are provided a polishing apparatus, a cleaner, a cleaning method and a wafer evacuation program which can prevent the oxidation and modification of a wafer surface in each step, such as the polishing step of a wafer, the transfer step after polishing, the cleaning step after polishing, the drying step after polishing, the inspection step after polishing, and the storage step after polishing.
REFERENCES:
patent: 5527390 (1996-06-01), Ono et al.
patent: 5788448 (1998-08-01), Wakamori et al.
patent: 6335286 (2002-01-01), Lansford
patent: 6343239 (2002-01-01), Toda et al.
patent: 6406589 (2002-06-01), Yanagisawa
patent: 6578589 (2003-06-01), Mayusumi et al.
patent: 6654698 (2003-11-01), Nulman
patent: 2003/0092261 (2003-05-01), Kondo et al.
patent: 0 806 265 (1997-11-01), None
patent: 1 155 778 (2001-11-01), None
patent: WO 02/47139 (2002-06-01), None
Electronic Materials, vol. 40, No. 3, p. 96.
The Latest CMP Process and Material Technlogy Supervised by Toshiro Doi and Masaharu Kinoshita, Technical Information Society, p. 257, p. 261, p. 272.
Nixon & Peabody LLP
Safran David S.
Thomas David B.
Tokyo Seimitsu Co. Ltd.
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