Abrading – Precision device or process - or with condition responsive... – With feeding of tool or work holder
Reexamination Certificate
2011-05-17
2011-05-17
Nguyen, Dung Van (Department: 3723)
Abrading
Precision device or process - or with condition responsive...
With feeding of tool or work holder
C451S289000, C451S388000, C451S398000
Reexamination Certificate
active
07942725
ABSTRACT:
A polishing apparatus has a top ring configured to hold a semiconductor wafer on a substrate holding surface, and a pushser configured to deliver the semiconductor wafer to the top ring and receive the semiconductor wafer from the top ring. The pushser includes a push stage having a substrate placement surface on which the semiconductor wafer is placed and an air cylinder configured to vertically move the push stage. The pushser also includes a high-pressure fluid port configured to eject a high-pressure fluid toward the semiconductor wafer.
REFERENCES:
patent: 5738574 (1998-04-01), Tolles et al.
patent: 6080046 (2000-06-01), Shendon et al.
patent: 6086457 (2000-07-01), Perlov et al.
patent: 6102057 (2000-08-01), Vogtmann et al.
patent: 6126517 (2000-10-01), Tolles et al.
patent: 6131589 (2000-10-01), Vogtmann et al.
patent: 6267642 (2001-07-01), Vogtmann et al.
patent: 6283827 (2001-09-01), Vogtmann et al.
patent: 6325698 (2001-12-01), Wada et al.
patent: 6354922 (2002-03-01), Sakurai et al.
patent: 6358128 (2002-03-01), Sakurai et al.
patent: 6390905 (2002-05-01), Korovin et al.
patent: 6405740 (2002-06-01), Vogtmann et al.
patent: 6505635 (2003-01-01), Vogtmann et al.
patent: 6764387 (2004-07-01), Chen
patent: 6796881 (2004-09-01), Vogtmann et al.
patent: 6840846 (2005-01-01), Boo et al.
patent: 6857945 (2005-02-01), Chen et al.
patent: 7044832 (2006-05-01), Yilmaz et al.
patent: 7044833 (2006-05-01), Yun et al.
patent: 7063598 (2006-06-01), Isobe et al.
patent: 7645185 (2010-01-01), Isobe et al.
patent: 2001/0055937 (2001-12-01), Wada et al.
patent: 2002/0045410 (2002-04-01), Sakurai et al.
patent: 2002/0151260 (2002-10-01), Crevasse et al.
patent: 2003/0211812 (2003-11-01), Isobe et al.
patent: 2004/0137823 (2004-07-01), Sakurai et al.
patent: 2004/0221874 (2004-11-01), Wada et al.
patent: 0 774 323 (1997-05-01), None
patent: 1 034 887 (2000-09-01), None
patent: 8-229807 (1996-09-01), None
patent: 99/41022 (1999-08-01), None
International Search Report issued Jan. 20, 2005 in International Application No. PCT/JP2004/015566.
Chinese Second Office Action issued Dec. 12, 2008 in Chinese Application No. 2004800301959.
Hayama Takuji
Torii Hiroomi
Yashima Tetsuya
Ebara Corporation
Nguyen Dung Van
Wenderoth , Lind & Ponack, L.L.P.
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