Polishing apparatus

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With means for passing discrete workpiece through plural...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C156S345120, C156S345140

Reexamination Certificate

active

07632378

ABSTRACT:
A polishing apparatus is used for polishing a workpiece such as a semiconductor wafer to a flat mirror finish. The polishing apparatus comprises a turntable having a polishing surface, a top ring for holding a workpiece and pressing the workpiece against the polishing surface to polish the workpiece, at least three cleaning apparatuses for cleaning polished workpieces, and a transfer structure for transferring the polished workpieces between at least three cleaning apparatuses. The polishing apparatus further includes a rotary transporter disposed in a position which can be accessed by said top rings and having a plurality of portions positioned on a predetermined circumference from a center of rotation of the rotary transporter for holding the workpieces.

REFERENCES:
patent: 3659386 (1972-05-01), Goetz et al.
patent: 3906678 (1975-09-01), Roth
patent: 3913271 (1975-10-01), Boettcher
patent: 4141180 (1979-02-01), Gill, Jr. et al.
patent: 4583909 (1986-04-01), Yamashita et al.
patent: 4680893 (1987-07-01), Cronkhite et al.
patent: 4981408 (1991-01-01), Hughes et al.
patent: 4985722 (1991-01-01), Ushijima et al.
patent: 5032052 (1991-07-01), Swain
patent: 5061144 (1991-10-01), Akimoto et al.
patent: 5100516 (1992-03-01), Nishimura et al.
patent: 5145303 (1992-09-01), Clarke
patent: 5186594 (1993-02-01), Toshima et al.
patent: 5232875 (1993-08-01), Tuttle et al.
patent: 5275709 (1994-01-01), Anderle et al.
patent: 5329732 (1994-07-01), Karlsrud et al.
patent: 5387067 (1995-02-01), Grunes
patent: 5460478 (1995-10-01), Akimoto et al.
patent: 5498199 (1996-03-01), Karlsrod et al.
patent: 5551986 (1996-09-01), Jain
patent: 5554064 (1996-09-01), Breivogel et al.
patent: 5562524 (1996-10-01), Gill, Jr.
patent: 5564889 (1996-10-01), Araki
patent: 5571325 (1996-11-01), Ueyama et al.
patent: 5616063 (1997-04-01), Okumura et al.
patent: 5618227 (1997-04-01), Tsutsumi et al.
patent: 5628828 (1997-05-01), Kawamura et al.
patent: 5649854 (1997-07-01), Gill, Jr.
patent: 5655954 (1997-08-01), Oishi et al.
patent: 5679059 (1997-10-01), Nishi et al.
patent: 5718618 (1998-02-01), Guckel et al.
patent: 5738574 (1998-04-01), Tolles et al.
patent: 5746565 (1998-05-01), Tepolt
patent: 5827110 (1998-10-01), Yajima et al.
patent: 5830045 (1998-11-01), Togawa et al.
patent: 5839947 (1998-11-01), Kimura et al.
patent: 5885138 (1999-03-01), Okumura et al.
patent: 5893794 (1999-04-01), Togawa et al.
patent: 5893795 (1999-04-01), Perlov et al.
patent: 5897426 (1999-04-01), Somekh
patent: 5951373 (1999-09-01), Shendon et al.
patent: 5963753 (1999-10-01), Ohtani et al.
patent: 5989107 (1999-11-01), Shimizu et al.
patent: 6036582 (2000-03-01), Aizawa et al.
patent: 6050884 (2000-04-01), Togawa et al.
patent: 6062954 (2000-05-01), Izumi
patent: 6156124 (2000-12-01), Tobin
patent: 6180020 (2001-01-01), Moriyama et al.
patent: 6293855 (2001-09-01), Yoshida et al.
patent: 6332826 (2001-12-01), Katsuoka et al.
patent: 6358128 (2002-03-01), Sakurai et al.
patent: 6413156 (2002-07-01), Shimizu et al.
patent: 197634 (1908-04-01), None
patent: 0 517 594 (1992-12-01), None
patent: 0 684 634 (1995-11-01), None
patent: 0761387 (1997-03-01), None
patent: 0793261 (1997-09-01), None
patent: 807 492 (1997-11-01), None
patent: 0807492 (1997-11-01), None
patent: 874 309 (1998-10-01), None
patent: 0928662 (1999-07-01), None
patent: 64-42823 (1989-02-01), None
patent: 2-208931 (1990-08-01), None
patent: 02247384 (1990-10-01), None
patent: 2-267950 (1990-11-01), None
patent: 4-69147 (1992-03-01), None
patent: 5-74749 (1993-03-01), None
patent: 5-285807 (1993-11-01), None
patent: 7-135192 (1995-05-01), None
patent: 8-64562 (1996-03-01), None
patent: 9-232257 (1997-09-01), None
patent: 10-256201 (1998-09-01), None
patent: 82/03038 (1982-09-01), None
patent: 96/36459 (1996-11-01), None
patent: 97/10613 (1997-03-01), None
Kaitoh Tei et al., “Planarization of Device Wafer with Fixed Abrasive Particles (Second Report)”—Planarization Working Characteristics with Fine Silica Grindstone—, from the Japan Society for Precision Engineering.
U.S. Appl. No. 09/518,958, filed Mar. 3, 2000, entitled “Polishing Apparatus”, by Kunihiko Sakurai et al., a C-I-P of U.S. Appl. No. 09/476,905, filed Jan. 3, 2000.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Polishing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Polishing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Polishing apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4106329

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.