Abrading – Precision device or process - or with condition responsive... – By optical sensor
Reexamination Certificate
2006-04-04
2006-04-04
Shakeri, Hadi (Department: 3723)
Abrading
Precision device or process - or with condition responsive...
By optical sensor
C451S005000, C451S287000, C438S016000
Reexamination Certificate
active
07021991
ABSTRACT:
A polishing apparatus has a polishing table having a polishing surface, a top ring for holding a workpiece to be polished and pressing the workpiece against the polishing surface on the polishing table, and a film thickness measuring device embedded in the polishing table. The film thickness measuring device includes a light source for applying light having a predetermined wavelength to a surface of the workpiece, a spectroscope for separating light reflected from the surface of the workpiece, and a charge coupled device array for capturing light separated by the spectroscope. The polishing apparatus also has a controller operable to analyze information captured by the charge coupled device array over the entire surface of the workpiece to obtain a film thickness at a desired point on the surface of the workpiece.
REFERENCES:
patent: 5254830 (1993-10-01), Zarowin et al.
patent: 5672091 (1997-09-01), Takahashi et al.
patent: 5838447 (1998-11-01), Hiyama et al.
patent: 5893796 (1999-04-01), Birang et al.
patent: 5899792 (1999-05-01), Yagi
patent: 5910846 (1999-06-01), Sandhu
patent: 6004187 (1999-12-01), Nyui et al.
patent: 6102775 (2000-08-01), Ushio et al.
patent: 6108092 (2000-08-01), Sandhu
patent: 6159073 (2000-12-01), Wiswesser et al.
patent: 6280289 (2001-08-01), Wiswesser et al.
patent: 6296548 (2001-10-01), Wiswesser et al.
patent: 6334807 (2002-01-01), Lebel et al.
patent: 6399501 (2002-06-01), Birang et al.
patent: 6476921 (2002-11-01), Saka et al.
patent: 6494766 (2002-12-01), Wiswesser et al.
patent: 6503767 (2003-01-01), Korovin
patent: 6506097 (2003-01-01), Adams et al.
patent: 6511363 (2003-01-01), Yamane et al.
patent: 6524165 (2003-02-01), Wiswesser et al.
patent: 6537832 (2003-03-01), Otsubo et al.
patent: 6607422 (2003-08-01), Swedek et al.
patent: 6716085 (2004-04-01), Wiswesser et al.
patent: 6719818 (2004-04-01), Birang et al.
patent: 6821794 (2004-11-01), Laursen et al.
patent: 1066925 (2001-01-01), None
patent: 02/103777 (2002-12-01), None
patent: 02/103779 (2002-12-01), None
Ohta Shinro
Shimizu Kazuo
Tsukada Akihiro
Ebara Corporation
Shakeri Hadi
Wenderoth , Lind & Ponack, L.L.P.
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