Polarized lightwave reflectometry method (POTDR)

Optics: measuring and testing – For optical fiber or waveguide inspection

Reexamination Certificate

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Reexamination Certificate

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07362427

ABSTRACT:
A polarized lightwave reflectometry method including the steps of sending at least two polarized light signals into the optical fiber to be tested, the signals presenting a determined angular offset relative to each other so that the polarization mode dispersion coefficient remains independent of any rotation of polarization in the optical fiber under test; extracting a scalar parameter of the relative noise type for each trace obtained by back-scattering of the light signal; and estimating the polarization mode dispersion coefficient by a function having a single scalar input, which function is of the type based on exponentials and has the form exp (a+bP+cP−1).

REFERENCES:
patent: 4997277 (1991-03-01), Horiguchi et al.
patent: 6229599 (2001-05-01), Galtarossa
patent: 6504604 (2003-01-01), Holland
patent: 6724469 (2004-04-01), Leblanc
patent: 19825876 (1999-12-01), None
patent: 0 681 172 (1995-11-01), None
patent: 0433020 (2001-06-01), None
“PMD Measurement With a Polarization-OTDR”; Wuipart, et al.; XP-001158413; Sep. 12, 2002.
“Distributed PMD Measurement With a Polarization-OTDR in Optical Fibers”; Hunters, et al.; p. 1843-1848; IEEE, 1999.
“High Sensitivity and Submillimeter Resolution Optical Time-Domain Reflectometry Based on Low-Coherence Interference;” Takada, et al.; IEEE 1992.
Patent Abstracts of Japan; 2002048680; Aug. 1, 2000; Takeshi.
A Galtarossa et al., “Single-End Polarization Mode Dispersion Measurement Using Backreflected Spectra Through a Linear Polarizer”, Journal of Lightwave Technology, IEEE, NY, US vol. 17, No. 10, Oct. 1999 pp. 1835-1842, XP000984134.
A. Galtarossa, Polarization-Sensitive Reflectometric Techniques for PMD Measurements, XP-001035400, 25thEuropean Conference on Optical Communication. (ECOC '99). Nice, France Sep. 27-30, 1999, Sep. 26, 1999.

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