Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2004-05-12
2008-10-28
Chowdhury, Tarifur R. (Department: 2886)
Optics: measuring and testing
By polarized light examination
Reexamination Certificate
active
07443503
ABSTRACT:
The invention aims to provide a miniaturized polarization measuring apparatus which can measure the polarization of input signal light with high accuracy, even in an optical system where a plurality of light receiving elements are arranged adjacent to each other. To this end, in the polarization measuring apparatus which branches the input signal light into four signal lights by optical couplers in a three stage configuration, and provides the signal lights with polarizations and the phase shifts, which are different for each signal light, by a plurality of optical elements arranged on branched optical paths, and detects the signal light powers by corresponding light receiving elements, and calculates the Stokes parameters or the like, based on the detection results, to thereby measure the polarization of the input signal light, the elements are arranged to be inclined to each other, so that an interference system is not formed between the adjacent elements on the same branched optical path, and also there is provided a shielding wall so that a stray light generated between these elements does not reach the light receiving element on another branched optical path.
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Japanese Patent Office Action, mailed May 13, 2008 and issued in corresponding Japanese Patent Application NO. 2003-375749.
Kubo Teruhiro
Oikawa Yoichi
Akanbi Isiaka O
Chowdhury Tarifur R.
Fujitsu Limited
Staas & Halsey , LLP
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